Fourier-transform emission-decay matrix measurements, i.e., wavelength and frequency-resolved dynamic fluorescence measurements will be used to investigate the progress of photo-induced weathering of functionalized semiconductor quantum dots. Multivariate data analysis will be used to extract spectral details linked to changes in QD structure, the extent of QD surface passivation, weathering mechanism(s), i.e., ROS (Reactive Oxygen Species) reactions, and aggregation. Ultimately, these studies will increase our understanding of photo-induced processes that contribute to the degradation of functionalized quantum dots in complex environments.

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